Formation of a stable ohmic contact to CdTe thin films through the diffusion of P from Ni-P

B. Ghosh, S. Purakayastha, Psantu Datta, Robert Miles, M. J. Carter, Robert Hill

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    20 Citations (Scopus)


    Thin films of CdTe used in electronic devices often have problems with electrical contacts. This is due to the non-availability of a contacting material with a large work function for proper matching with p-CdTe. Moreover, the method of doping the thin film is the real problem. There are several possible solutions in this connection, one of which is the formation of a p + layer on the CdTe surface by the reaction or indiffusion of dopant materials. Another approach is to engineer the barrier height prior to the metal contact deposition by depositing a layer of Cu-doped ZnTe onto the CdTe. However, all of the above methods have their own limitations. In this paper a method is presented which can overcome these limitations. Using an autocatalytic reduction process, NbP composite material has been deposited successfully on the p-CdTe surface. On annealing at an optimum temperature of 250 degrees C, the contact resistivity comes down to 0.1-0.08 Omega cm 2. XRD and EDAX studies reveal that the lowering of the contact resistance is due to the diffusion of P into the CdTe with the formation of a p + layer. A model for this has also been presented in the text.
    Original languageEnglish
    Pages (from-to)71-76
    JournalSemiconductor Science and Technology
    Issue number1
    Publication statusPublished - Jan 1995


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