Size Dependence of the 2p-Level Shift of Nanosolid Silicon

Chang Qing Sun, L. K. Pan, Yong Qing Fu, Beng Kang Tay, Sean Li

Research output: Contribution to journalArticlepeer-review

51 Citations (Scopus)


Modeling exercises on the size-induced blue-shift in the photoluminescence (PL) of nanosolid Si (J. Phys. Chem. B 2002, 106, 11725) have been extended herewith to the size dependence of the Si-2p energy-level-shift measured using X-ray photoelectron spectroscopy (XPS). Results show consistency in both the origin and trend of the core-level shift with that of band-gap expansion upon Si nanosolid formation. Most strikingly, decoding the size dependent XPS peak shift leads to quantitative information about the 2p-level atomic trapping energy of an isolated Si atom (−96.74 eV) and the crystal binding intensity (−2.46 eV) upon bulk solid formation, which is beyond the scope of direct measurement using currently available techniques.
Original languageEnglish
Pages (from-to)5113-5115
JournalThe Journal of Physical Chemistry B
Issue number22
Publication statusPublished - 2003


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